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Comparison of methods for the characterisation by image analysis of crystalline agglomerates : The case of gibbsite

Identifieur interne : 00A713 ( Main/Exploration ); précédent : 00A712; suivant : 00A714

Comparison of methods for the characterisation by image analysis of crystalline agglomerates : The case of gibbsite

Auteurs : M. N. Pons [France] ; V. Plagnieux [France] ; H. Vivier [France] ; D. Audet [Australie]

Source :

RBID : Pascal:05-0483933

Descripteurs français

English descriptors

Abstract

Four imaging techniques (light microscopy technique (P-OM), scanning electron microscopy with a secondary electron detector applied to powders (P-SE-SEM), scanning electron microscopy with a backscattered electron detector applied to polished sections of powders embedded in a resin, without chemical etching (S-BS-SEM) and scanning electron microscopy with a secondary electron detector applied to polished sections of powders embedded in a resin, with chemical etching (S-SE-SEM)) have been applied to crystalline agglomerates (gibbsite) to illustrate the possibilities of structural characterisation and comparison based on image analysis procedures. If P-OM can be easily applied in industry, once a suitable immersion liquid has been selected, the information collected from P-SE-SEM on the external structure is more detailed. S-BS-SEM enables the visualisation of larger sets of particles but bias, due to sectioning, should be accepted. It is IS related to the shape of particles. S-SE-SEM provides information on the external structure as S-BS-SEM and, in addition, on the internal structure, but with a lower output than S-BS-SEM.


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Le document en format XML

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<div type="abstract" xml:lang="en">Four imaging techniques (light microscopy technique (P-OM), scanning electron microscopy with a secondary electron detector applied to powders (P-SE-SEM), scanning electron microscopy with a backscattered electron detector applied to polished sections of powders embedded in a resin, without chemical etching (S-BS-SEM) and scanning electron microscopy with a secondary electron detector applied to polished sections of powders embedded in a resin, with chemical etching (S-SE-SEM)) have been applied to crystalline agglomerates (gibbsite) to illustrate the possibilities of structural characterisation and comparison based on image analysis procedures. If P-OM can be easily applied in industry, once a suitable immersion liquid has been selected, the information collected from P-SE-SEM on the external structure is more detailed. S-BS-SEM enables the visualisation of larger sets of particles but bias, due to sectioning, should be accepted. It is IS related to the shape of particles. S-SE-SEM provides information on the external structure as S-BS-SEM and, in addition, on the internal structure, but with a lower output than S-BS-SEM.</div>
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